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Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.]. 9 July, 2002, Seattle, Washington, USA /

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Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors:	Gu, Zu-Han, Maradudin, A. A.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, c2002.
Series:	SPIE proceedings series ; v. 4780
Subjects:	Surface roughness > Measurement > Congresses Diffractive scattering > Congresses Optical measurements > Congresses Scattering (Physics) > Congresses Metrology > Congresses
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