Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA / Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Saved in:
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
c2004.
|
| Series: | SPIE proceedings series,
v. 5303 |
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|