Alford, T. L., Feldman, L. C., & Mayer, J. W. (2006). Fundamentals of Nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. Springer.
Chicago Style (17th ed.) CitationAlford, Terry L., Leonard C. Feldman, and James W. Mayer. Fundamentals of Nanoscale Film Analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. New York ; London: Springer, 2006.
MLA (9th ed.) CitationAlford, Terry L., et al. Fundamentals of Nanoscale Film Analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. Springer, 2006.
Warning: These citations may not always be 100% accurate.