Library Catalogue Plus

APA (7th ed.) Citation

Breitenstein, O., Warta, W., & Langenkamp, M. (2010). Lock-in thermography : basics and use for evaluating electronic devices and materials: Basics and use for evaluating electronic devices and materials (2nd ed.). Springer.

Chicago Style (17th ed.) Citation

Breitenstein, O., Wilhelm Warta, and M. Langenkamp. Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials: Basics and Use for Evaluating Electronic Devices and Materials. 2nd ed. Heidelberg ; London: Springer, 2010.

MLA (9th ed.) Citation

Breitenstein, O., et al. Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials: Basics and Use for Evaluating Electronic Devices and Materials. 2nd ed. Springer, 2010.