APA (7th ed.) Citation

IEEE International Conference on Microelectronic Test Structures Austin, Tex., IEEE Electron Devices Society, & IEEE Xplore (Online service). (2006). ICMTS 2006 proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / sponsored by the IEEE Electron Devices Society: Proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006. IEEE.

Chicago Style (17th ed.) Citation

IEEE International Conference on Microelectronic Test Structures Austin, Tex., IEEE Electron Devices Society, and IEEE Xplore (Online service). ICMTS 2006 Proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / Sponsored by the IEEE Electron Devices Society: Proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006. Piscataway, NJ: IEEE, 2006.

MLA (9th ed.) Citation

IEEE International Conference on Microelectronic Test Structures Austin, Tex., et al. ICMTS 2006 Proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / Sponsored by the IEEE Electron Devices Society: Proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006. IEEE, 2006.

Warning: These citations may not always be 100% accurate.