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Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Czech Technical University in Prague. April 18-21, 2006, Prague, Czech Republic /

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Bibliographic Details
Corporate Authors: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems Prague, Czech Republic, IEEE Computer Society. Technical Council on Test Technology, Ceske vysoke uceni technicke v Praze, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, 2006.
Subjects:
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=10974
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040 |a GAT  |c GAT  |d E9X 
111 2 |a IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems  |n (9th :  |d 2006 :  |c Prague, Czech Republic) 
245 1 0 |a Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems  |h [electronic resource] :  |b April 18-21, 2006, Prague, Czech Republic /  |c sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Czech Technical University in Prague. 
246 1 3 |a 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems 
246 3 |a Ninth IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems 
246 1 |i Also known as:  |a DDECS 
260 |a Los Alamitos, Calif. :  |b IEEE Computer Society,  |c 2006. 
500 |a Some information from the DDECS website (http://ddecs06.felk.cvut.cz/) as of October 26, 2006. 
650 0 |a Integrated circuits  |x Testing  |v Congresses. 
650 0 |a Integrated circuits  |x Design  |v Congresses. 
650 0 |a Microelectronics  |x Design  |v Congresses. 
650 0 |a Microelectronics  |x Testing  |v Congresses. 
710 2 |a IEEE Computer Society.  |b Technical Council on Test Technology. 
710 2 |a Ceske vysoke uceni technicke v Praze.  |9 2429467 
710 2 |a IEEE Xplore (Online service) 
740 0 |a Design and diagnostics of electronic circuits and systems, 2006 IEEE. 
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