2006 IEEE International Workshop on Memory Technology, Design, and Testing 2-4 August 2006, Taipei, Taiwan : proceedings / sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan ; in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society. 2-4 August 2006, Taipei, Taiwan : proceedings /

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Memory Technology, Design, and Testing Taipei, Taiwan, IEEE Computer Society. Technical Council on Test Technology, IEEE Computer Society. Technical Committee on VLSI, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2006.
Subjects:
Semiconductor storage devices > Testing > Congresses.
Random access memory > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=11003
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