Asian Test Symposium Fukuoka-shi, Japan, IEEE Computer Society. Technical Council on Test Technology, Denshi Joho Tsushin Gakkai (Japan). Technical Group on Dependable Computing, Kyushu Kogyo Daigaku, & IEEE Xplore (Online service). (2006). Proceedings of the 15th Asian Test Symposium 20-23 November 2006, Fukuoka, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC), Technical Group on Dependable Computing, ISS, IEICE, Kyushu Institute of Technology: 20-23 November 2006, Fukuoka, Japan. IEEE Computer Society.
Chicago Style (17th ed.) CitationAsian Test Symposium Fukuoka-shi, Japan, IEEE Computer Society. Technical Council on Test Technology, Denshi Joho Tsushin Gakkai (Japan). Technical Group on Dependable Computing, Kyushu Kogyo Daigaku, and IEEE Xplore (Online service). Proceedings of the 15th Asian Test Symposium 20-23 November 2006, Fukuoka, Japan / Sponsored by IEEE Computer Society Test Technology Council (TTTC), Technical Group on Dependable Computing, ISS, IEICE, Kyushu Institute of Technology: 20-23 November 2006, Fukuoka, Japan. Los Alamitos, Calif.: IEEE Computer Society, 2006.
MLA (9th ed.) CitationAsian Test Symposium Fukuoka-shi, Japan, et al. Proceedings of the 15th Asian Test Symposium 20-23 November 2006, Fukuoka, Japan / Sponsored by IEEE Computer Society Test Technology Council (TTTC), Technical Group on Dependable Computing, ISS, IEICE, Kyushu Institute of Technology: 20-23 November 2006, Fukuoka, Japan. IEEE Computer Society, 2006.