Library Catalogue Plus

APA (7th ed.) Citation

IEEE International Conference on Microelectronic Test Structures University of Tokyo, IEEE Electron Devices Society, & IEEE Xplore (Online service). (2007). 2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society]: ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan. IEEE.

Chicago Style (17th ed.) Citation

IEEE International Conference on Microelectronic Test Structures University of Tokyo, IEEE Electron Devices Society, and IEEE Xplore (Online service). 2007 IEEE International Conference on Microelectronic Test Structures ICMTS : Conference Proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society]: ICMTS : Conference Proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan. Piscataway, NJ: IEEE, 2007.

MLA (9th ed.) Citation

IEEE International Conference on Microelectronic Test Structures University of Tokyo, et al. 2007 IEEE International Conference on Microelectronic Test Structures ICMTS : Conference Proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society]: ICMTS : Conference Proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan. IEEE, 2007.