Asian Test Symposium Beijing, China, IEEE Computer Society. Technical Council on Test Technology, Institute of Computing Technology, IEEE Computer Society. Fault-Tolerant Computing Technical Committee, & Guo jia zi ran ke xue ji jin wei yuan hui (China). (2007). Proceedings of the 16th Asian Test Symposium : 8-11 October, 2007, Beijing, China / sponsored by IEEE Computer Society Test Technology Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC): 8-11 October, 2007, Beijing, China. IEEE Computer Society.
Chicago Style (17th ed.) CitationAsian Test Symposium Beijing, China, IEEE Computer Society. Technical Council on Test Technology, Institute of Computing Technology, IEEE Computer Society. Fault-Tolerant Computing Technical Committee, and Guo jia zi ran ke xue ji jin wei yuan hui (China). Proceedings of the 16th Asian Test Symposium : 8-11 October, 2007, Beijing, China / Sponsored by IEEE Computer Society Test Technology Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in Cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC): 8-11 October, 2007, Beijing, China. Los Alamitos, Calif.: IEEE Computer Society, 2007.
MLA (9th ed.) CitationAsian Test Symposium Beijing, China, et al. Proceedings of the 16th Asian Test Symposium : 8-11 October, 2007, Beijing, China / Sponsored by IEEE Computer Society Test Technology Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in Cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC): 8-11 October, 2007, Beijing, China. IEEE Computer Society, 2007.