International Symposium on the Physical & Failure Analysis of Integrated Circuits Indian Institute of Science, IEEE ED/SSC Chapter, Bangalore, IEEE Reliability/CPMT/ED Singapore Chapter, IEEE ED/AP Chapter, Bombay, IEEE Electron Devices Society, Mahapatra, S., & Radhakrishnan, M. K. (2007). Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay: IPFA 2007. IEEE.
Chicago Style (17th ed.) CitationInternational Symposium on the Physical & Failure Analysis of Integrated Circuits Indian Institute of Science, Bangalore IEEE ED/SSC Chapter, IEEE Reliability/CPMT/ED Singapore Chapter, Bombay IEEE ED/AP Chapter, IEEE Electron Devices Society, Souvik Mahapatra, and M. K. Radhakrishnan. Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / Edited by Souvik Mahapatra, M.K. Radhakrishnan ; Organised by IEEE ED/SSC Chapter, Bangalore, India ; Technically Co-sponsored by IEEE Electron Devices Society ... [et Al.] ; in Co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay: IPFA 2007. Piscataway, NJ: IEEE, 2007.
MLA (9th ed.) CitationInternational Symposium on the Physical & Failure Analysis of Integrated Circuits Indian Institute of Science, et al. Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / Edited by Souvik Mahapatra, M.K. Radhakrishnan ; Organised by IEEE ED/SSC Chapter, Bangalore, India ; Technically Co-sponsored by IEEE Electron Devices Society ... [et Al.] ; in Co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay: IPFA 2007. IEEE, 2007.