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APA (7th ed.) Citation

IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems Cambridge, Mass, & IEEE Computer Society. Technical Council on Test Technology. (2008). NDCS 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts / sponsored by IEEE Computer Society, IEEE Test Technology Technical Council: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts. IEEE.

Chicago Style (17th ed.) Citation

IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems Cambridge, Mass, and IEEE Computer Society. Technical Council on Test Technology. NDCS 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts / Sponsored by IEEE Computer Society, IEEE Test Technology Technical Council: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts. [Piscataway, N.J.]: IEEE, 2008.

MLA (9th ed.) Citation

IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems Cambridge, Mass, and IEEE Computer Society. Technical Council on Test Technology. NDCS 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts / Sponsored by IEEE Computer Society, IEEE Test Technology Technical Council: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts. IEEE, 2008.