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Wavelet Analysis and Pattern Recognition, 2008, ICWAPR '08, International Conference on

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Bibliographic Details
Corporate Author:	International Conference on Wavelet Analysis and Pattern Recognition Hong Kong, China
Format:	eBook
Language:	English
Published:	[Piscataway, N.J.] : IEEE Xplore, c2008.
Subjects:	Wavelets (Mathematics) > Congresses. Wavelengths > Data processing > Congresses. Pattern perception > Congresses. Imaging systems > Congresses.
Online Access:	Restricted to IEEE Xplore subscribers
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