2007 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 15-18, 2007 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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Bibliographic Details
Corporate Authors: International Integrated Reliability Workshop South Lake Tahoe, Calif., IEEE Electron Devices Society, IEEE Reliability Society, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: [Piscataway, N.J.] : Electron Devices Society : Reliability Society, c2007.
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Online Access:Access restricted to subscribers
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