IEEE International Conference on Microelectronic Test Structures University of Edinburgh & IEEE Xplore (Online service). (2008). 2008 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 24-27, the University of Edinburgh, UK: ICMTS : conference proceedings : March 24-27, the University of Edinburgh, UK. IEEE.
Chicago Style (17th ed.) CitationIEEE International Conference on Microelectronic Test Structures University of Edinburgh and IEEE Xplore (Online service). 2008 IEEE International Conference on Microelectronic Test Structures ICMTS : Conference Proceedings : March 24-27, the University of Edinburgh, UK: ICMTS : Conference Proceedings : March 24-27, the University of Edinburgh, UK. Piscataway, NJ: IEEE, 2008.
MLA (9th ed.) CitationIEEE International Conference on Microelectronic Test Structures University of Edinburgh and IEEE Xplore (Online service). 2008 IEEE International Conference on Microelectronic Test Structures ICMTS : Conference Proceedings : March 24-27, the University of Edinburgh, UK: ICMTS : Conference Proceedings : March 24-27, the University of Edinburgh, UK. IEEE, 2008.