International Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore. (2008). Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2008 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE ED/SSC Chapter: IPFA 2008. IEEE Reliability Society.
Chicago Style (17th ed.) CitationInternational Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore. Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2008 / Edited by Gan Chee Lip ... [et Al.] ; Organised by IEEE ED/SSC Chapter: IPFA 2008. Piscataway, N.J.: IEEE Reliability Society, 2008.
MLA (9th ed.) CitationInternational Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore. Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2008 / Edited by Gan Chee Lip ... [et Al.] ; Organised by IEEE ED/SSC Chapter: IPFA 2008. IEEE Reliability Society, 2008.