IEEE Symposium on Visual Analytics Science and Technology, 2008 Columbus, Ohio, USA, October 21-23, 2008 : proceedings / edited by David Ebert, Thomas Ertl ; sponsored by IEEE Computer Society Visualization and Graphics Technical Committee in cooperation with ACM SIGGRAPH.
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| Corporate Authors: | , , |
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Piscataway, N.J. :
IEEE,
c2008.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4669530 |
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