2009 International Conference on Biometrics and Kansei Engineering ICBAKE 2009 : proceedings, 25-28 June 2009, Cieszyn, Poland / [edited by Kahalid Saeed, Ajith Abraham, Piotr Porwik.

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Bibliographic Details
Corporate Authors: International Conference on Biometrics and Kansei Engineering Cieszyn, Wojewdztwo Slaskie, Poland, IEEE Computer Society
Other Authors: Saeed, Kahalid, Abraham, Ajith, 1968-, Porwik, Piotr
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2009.
Subjects:
Consumer goods > Psychological aspects > Congresses.
New products > Congresses.
Design > Psychological aspects > Congresses.
Biometry > Congresses.
Image analysis > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=5223158
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