APA (7th ed.) Citation

Sharma, A. K. (1997). Semiconductor memories technology, testing, and reliability / Ashok K. Sharma: Technology, testing, and reliability. IEEE Press ; Institute of Electrical and Electronics Engineers.

Chicago Style (17th ed.) Citation

Sharma, Ashok K. Semiconductor Memories Technology, Testing, and Reliability / Ashok K. Sharma: Technology, Testing, and Reliability. Piscataway, N.J. : New York: IEEE Press ; Institute of Electrical and Electronics Engineers, 1997.

MLA (9th ed.) Citation

Sharma, Ashok K. Semiconductor Memories Technology, Testing, and Reliability / Ashok K. Sharma: Technology, Testing, and Reliability. IEEE Press ; Institute of Electrical and Electronics Engineers, 1997.

Warning: These citations may not always be 100% accurate.