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Semiconductor memories technology, testing, and reliability / Ashok K. Sharma. technology, testing, and reliability /

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Bibliographic Details
Main Author:	Sharma, Ashok K.
Corporate Author:	IEEE Solid-State Circuits Council
Format:	eBook
Language:	English
Published:	Piscataway, N.J. : New York : IEEE Press ; Institute of Electrical and Electronics Engineers, c1997.
Subjects:	Semiconductor storage devices.
Online Access:	http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
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