Symposium on advances in electron metallography and electron probe microanalysis sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography, held at Atlantic City, N. J., J

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Bibliographic Details
Corporate Authors: Symposium on Advances in Electron Metallography Atlantic City, N. J., American Society for Testing and Materials. Committee E-4 on Metallography, American Society for Testing and Materials
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1962.
Series:Journal of ASTM International. Selected technical papers ; STP 317.
Subjects:
Metallography > Congresses.
Electron microscopes > Congresses.
Electron metallography > Congresses.
Electron probe microanalysis > Congresses.
Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP317-EB%7Cen-US&proxycl=https%3A%2F%2Fsecure.astm.org&fromLogin=true
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111 2 |a Symposium on Advances in Electron Metallography   |d (1960-1961 :   |c Atlantic City, N. J.) 
245 1 0 |a Symposium on advances in electron metallography and electron probe microanalysis   |h [electronic resource] /   |c sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography, held at Atlantic City, N. J., J 
260 |a Philadelphia, Pa. :   |b American Society for Testing and Materials,   |c c1962. 
300 |a v, 207 p. :   |b ill., charts, tables, diagrs. 
490 1 |a ASTM STP;   |v 317 
500 |a "Papers presented in two technical sessions of ASTM under the sponsorship of Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."-- Foreword 
500 |a "This Special Technical Publication presents reports on new techniques and researches in the field of electron metallography and electron probe microanalysis."-- Foreword 
506 |a Login to VPN Client for off campus access. 
650 0 |a Metallography   |v Congresses. 
650 0 |a Electron microscopes   |v Congresses. 
650 0 |a Electron metallography   |v Congresses. 
650 0 |a Electron probe microanalysis   |v Congresses. 
710 2 |a American Society for Testing and Materials.   |b Committee E-4 on Metallography. 
710 2 |a American Society for Testing and Materials. 
830 0 |a Journal of ASTM International.   |p Selected technical papers ;   |v STP 317. 
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