Symposium on advances in electron metallography and electron probe microanalysis sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography, held at Atlantic City, N. J., J

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Bibliographic Details
Corporate Authors: Symposium on Advances in Electron Metallography Atlantic City, N. J., American Society for Testing and Materials. Committee E-4 on Metallography, American Society for Testing and Materials
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1962.
Series:Journal of ASTM International. Selected technical papers ; STP 317.
Subjects:
Metallography > Congresses.
Electron microscopes > Congresses.
Electron metallography > Congresses.
Electron probe microanalysis > Congresses.
Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP317-EB%7Cen-US&proxycl=https%3A%2F%2Fsecure.astm.org&fromLogin=true
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