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Symposium on advances in electron metallography and electron probe microanalysis sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography, held at Atlantic City, N. J., J

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Bibliographic Details
Corporate Authors:	Symposium on Advances in Electron Metallography Atlantic City, N. J., American Society for Testing and Materials. Committee E-4 on Metallography, American Society for Testing and Materials
Format:	eBook
Language:	English
Published:	Philadelphia, Pa. : American Society for Testing and Materials, c1962.
Series:	Journal of ASTM International. Selected technical papers ; STP 317.
Subjects:	Metallography > Congresses. Electron microscopes > Congresses. Electron metallography > Congresses. Electron probe microanalysis > Congresses.
Online Access:	https://compass.astm.org/document/?contentCode=ASTM%7CSTP317-EB%7Cen-US&proxycl=https%3A%2F%2Fsecure.astm.org&fromLogin=true
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