Symposium on X-ray and Electron Probe Analysis Atlantic City, N.J., ASTM Committee E-2 on Emission Spectroscopy, American Society for Testing and Materials. Committee E-4 on Metallography, American Society for Testing and Materials. Meeting, & American Society for Testing and Materials. (1964). Symposium on x-ray and electron probe analysis presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963: Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963. American Society for Testing and Materials.
Chicago Style (17th ed.) CitationSymposium on X-ray and Electron Probe Analysis Atlantic City, N.J., ASTM Committee E-2 on Emission Spectroscopy, American Society for Testing and Materials. Committee E-4 on Metallography, American Society for Testing and Materials. Meeting, and American Society for Testing and Materials. Symposium on X-ray and Electron Probe Analysis Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963: Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963. Philadelphia, Pa.: American Society for Testing and Materials, 1964.
MLA (9th ed.) CitationSymposium on X-ray and Electron Probe Analysis Atlantic City, N.J., et al. Symposium on X-ray and Electron Probe Analysis Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963: Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963. American Society for Testing and Materials, 1964.