Symposium on Electron Metallography Atlantic City, N.J., American Society for Testing and Materials, & ASTM Committee E-4 on Metallography. Subcommittee XI on Electron Microstructure of Metals. (1964). Techniques of electron microscopy, diffraction, and microprobe analysis presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963: Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963. American Society for Testing and Materials.
Chicago Style (17th ed.) CitationSymposium on Electron Metallography Atlantic City, N.J., American Society for Testing and Materials, and ASTM Committee E-4 on Metallography. Subcommittee XI on Electron Microstructure of Metals. Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963: Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963. Philadelphia, Pa.: American Society for Testing and Materials, 1964.
MLA (9th ed.) CitationSymposium on Electron Metallography Atlantic City, N.J., et al. Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963: Presented at the Sixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963. American Society for Testing and Materials, 1964.