ASTM International, ASTM Committee F-1 on Electronics, Gupta, D. C., Bacher, F. R., & Hughes, W. M. (1998). Recombination lifetime measurements in silicon Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors. ASTM International.
Chicago Style (17th ed.) CitationASTM International, ASTM Committee F-1 on Electronics, D. C. Gupta, Fred R. Bacher, and William M. Hughes. Recombination Lifetime Measurements in Silicon Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, Editors. West Conshohocken, Pa.: ASTM International, 1998.
MLA (9th ed.) CitationASTM International, et al. Recombination Lifetime Measurements in Silicon Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, Editors. ASTM International, 1998.
Warning: These citations may not always be 100% accurate.