Recombination lifetime measurements in silicon Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.

Saved in:
Bibliographic Details
Corporate Authors: ASTM International, ASTM Committee F-1 on Electronics
Other Authors: Gupta, D. C. (Dinesh C.) (ed.), Bacher, Fred R., 1955- (ed.), Hughes, William M., 1948- (ed.)
Format: eBook
Language:English
Published: West Conshohocken, Pa. : ASTM International, c1998.
Series:Journal of ASTM International. STP 1340.
Subjects:
Electronic measurements > Congresses.
Service life (Engineering) > Congresses.
Semiconductors > Testing > Congresses.
Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP1340-EB%7Cen-US
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items