APA (7th ed.) Citation

IGI Global, Ubar, R., Raik, J., & Vierhaus, H. T. (2011). Design and test technology for dependable systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, editors. IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA).

Chicago Style (17th ed.) Citation

IGI Global, Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus. Design and Test Technology for Dependable Systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, Editors. Hershey, Pa.: IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), 2011.

MLA (9th ed.) Citation

IGI Global, et al. Design and Test Technology for Dependable Systems-on-chip Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, Editors. IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), 2011.

Warning: These citations may not always be 100% accurate.