High speed 3-dimensional characterisation of graded CdSeTe/CdTe PV devices using a xenon plasma-focused ion beam (PFIB)

3D electron backscatter diffraction (3D EBSD) was carried out using a Xe-PFIB on CdTe thin film solar cells, with a graded CdSeTe (CST) layer. Devices with different ranges of CST and CdTe thickness were investigated. Grain size, texture, coincident site lattice (CSL) boundaries through the film thi...

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Bibliographic Details
Main Authors: Vlad Kornienko, Stuart Robertson, Ryan Maclachlan, Tushar Shimpi, Walajabad Sampath, Kurt L Barth, Thomas Fiducia, Ali Abbas, Yau Tse, Jake Bowers, Michael Walls
Format: Default Conference proceeding
Published: 2021
Subjects:
depth
texture
grain size
3D-EBSD
cst-ko
CdTe
photovoltaics
Online Access:https://hdl.handle.net/2134/16810996.v1
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https://hdl.handle.net/2134/16810996.v1

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