Determination of mode I and II adhesion toughness of Monolayer thin films by circular blister tests

Mechanical models are developed to determine the mode I and II adhesion toughness of monolayer thin films using circular blister tests under the pressure load. The interface fracture of monolayer thin film blisters is mode I dominant for linear bending with small deflection while it is mode II domin...

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Bibliographic Details
Main Authors: Christopher Harvey, Simon Wang, Bo Yuan, Rachel Thomson, Gary Critchlow
Format: Default Conference proceeding
Published: 2019
Subjects:
Materials engineering not elsewhere classified
Adhesion toughness
Circular blisters
Energy release rate
Interface fracture
Thin films
Materials Engineering not elsewhere classified
Online Access:https://hdl.handle.net/2134/33587
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