Eck, T., Walsh, S., Dale, M., & Taylor, N. (2004). Structural intensity measurement using electronic speckle pattern interferometry.
Chicago Style (17th ed.) CitationEck, Thomas, Stephen Walsh, M. Dale, and N.C Taylor. Structural Intensity Measurement Using Electronic Speckle Pattern Interferometry. 2004.
MLA (9th ed.) CitationEck, Thomas, et al. Structural Intensity Measurement Using Electronic Speckle Pattern Interferometry. 2004.
Warning: These citations may not always be 100% accurate.