Structural intensity measurement using electronic speckle pattern interferometry

Structural intensity measurement using electronic speckle pattern interferometry

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Bibliographic Details
Main Authors: Thomas Eck, Stephen Walsh, M. Dale, N.C. Taylor
Format: Default Article
Published: 2004
Subjects:
Other engineering not elsewhere classified
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Engineering not elsewhere classified
Online Access:https://hdl.handle.net/2134/6581
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