Stress induced by constrained sintering of 3YSZ films measured by substrate creep
3YSZ green layers approximately 10 μm thick were screen printed onto 3YSZ substrates up to 300 μm in thickness. The stress induced by constrained sintering of the film (between 1150° and 1350°C) was measured by monitoring the bending displacement of vertical strips of bilayers using a long-distance...
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| Main Authors: | , , , , |
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| Format: | Default Article |
| Published: |
2011
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/11232 |
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