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Noninvasive imaging of signals in digital circuits
In this article we describe the construction and use of a noninvasive (noncontact) electric potential probe to measure time delays of signals propagating through digital circuits. As we show, by incorporating such probes into a scanning microscope system we have been able to create time delay images...
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| Main Authors: | , , , , , |
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| Format: | Default Article |
| Published: |
2002
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/12071 |
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