Analysis of error functions in speckle shearing interferometry
Electronic Speckle Pattern Shearing Interferometry (ESPSI) or shearography has successfully been used in NDT for slope (δw/δx and/or δw/δy) measurement while strain measurement (δu/δx, δv/δy, δu/δy and δv/δx) is still under investigation This method is well accepted in industrial applications especi...
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| Format: | Default Thesis |
| Published: |
2001
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| Online Access: | https://hdl.handle.net/2134/33652 |
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