Synthetic aperture interferometry: measurement of steep aspherical surfaces using an anamorphic

Synthetic aperture interferometry (SAI) is a novel way of measuring aspherical optics (aspherics) where a scanning probe measures the optical path difference (OPD) between light reflected from the front (test) and rear (reference) surfaces of the aspheric optic. The surface form of the aspherical su...

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Bibliographic Details
Main Author: Amiya Biswas
Format: Default Thesis
Published: 2007
Subjects:
Mechanical engineering not elsewhere classified
Aspherical optics (aspherics)
Synthetic aperture interferometry
Interferometry
Phase evaluation
Optical path difference
Surface form
Metrology
Error analysis
Mechanical Engineering not elsewhere classified
Online Access:https://hdl.handle.net/2134/7983
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