Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry

A speckle shearing interferometer has been designed using symmetrical mutually incoherent illumination, in an effort to provide measurements of in-plane strain. An analysis of the sensitivity to displacement and strain of this interferometer is presented, together with analysis of the optical phase...

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Bibliographic Details

Main Authors:	Juan F. Roman, Vicente Moreno, Jon Petzing, John Tyrer
Format:	Default Article
Published:	2006
Subjects:	Mechanical engineering not elsewhere classified Foundations of quantum mechanics Speckle Interferometry Strain ESPI ESPSI Mechanical Engineering not elsewhere classified Quantum Mechanics
Online Access:	https://hdl.handle.net/2134/3635
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