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  1. 1
    2006 IEEE International Workshop on Memory Technology, Design, and Testing 2-4 August 2006, Taipei, Taiwan : proceedings / sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan ; in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society.

    2006 IEEE International Workshop on Memory Technology, Design, and Testing 2-4 August 2006, Taipei, Taiwan : proceedings / sponsored by IEEE Computer Society, Technical Council on...

    Published 2006
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  2. 2
    2007 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT '07)

    2007 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT '07)

    Published 2007
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  3. 3
    Dram circuit design fundamentals and high-speed topics / Brent Keeth ... [et. al.].

    Dram circuit design fundamentals and high-speed topics / Brent Keeth ... [et. al.].

    Published 2008
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  4. 4
    Introduction to magnetic random-access memory edited by Bernard Dieny, Ronald B. Goldfarb, Kyung-Jin Lee.

    Introduction to magnetic random-access memory edited by Bernard Dieny, Ronald B. Goldfarb, Kyung-Jin Lee.

    Published 2017
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