Search Results - Frankel, A E*
-
1
-
2
-
3
Structural and electrical characterization of polycrystalline NbO2 thin film vertical devices grown on TiN-coated SiO2/Si substrates
Published 2018“…First, we analyzed the thickness and contact size dependences of threshold switching of NbO2 films grown in 10 mTorr Ar/O2 mixed growth pressure, where 25.1%/74.9% of NbO2/Nb2O5 surface composition content was estimated by ex-situ x-ray photoelectron spectroscopy. …”
Get full text
Default Article