Search Results - Hutt, K

Author Results for Hutt, K

C.W. Tang
David Hutt
David Whalley
K.C. Hung
Patrick Webb
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Paul Conway
U.C. Chan

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    Scanning acoustic microscopy investigation of engineered flip-chip delamination

    Scanning acoustic microscopy investigation of engineered flip-chip delamination by David Hutt, David Whalley, Patrick Webb, K.C. Hung, C.W. Tang, Paul Conway, U.C. Chan

    Published 2000
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