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    Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

    Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. by Servin, Manuel, Quiroga, J. Antonio (Juan Antonio), Padilla, J. Moises (Jose Moises)

    Published 2014
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