Improved event-scanning mechanisms for discrete event simulation
Simulation models of large, complex "real-world" applications have occasionally earned the reputation of eating up hours of computer time. This problem may be attributed in part to difficulties such as slow stochastic convergence. However, an additional problem lies in the fact that a sign...
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| Published in: | Communications of the ACM 1975-06, Vol.18 (6), p.350-353 |
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| Main Author: | |
| Format: | Magazinearticle |
| Language: | English |
| Subjects: | |
| Citations: | Items that this one cites Items that cite this one |
| Online Access: | Get full text |
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