Improved event-scanning mechanisms for discrete event simulation

Simulation models of large, complex "real-world" applications have occasionally earned the reputation of eating up hours of computer time. This problem may be attributed in part to difficulties such as slow stochastic convergence. However, an additional problem lies in the fact that a sign...

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Bibliographic Details
Published in:Communications of the ACM 1975-06, Vol.18 (6), p.350-353
Main Author: Wyman, F. Paul
Format: Magazinearticle
Language:English
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