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Significantly Enhanced Conformal Contact by the Functional Layers on a Copper Film for Thermal Interface Materials
Low‐cost thermal interface materials with high thermal conductivity ( κ ) and low total thermal resistance ( R t ) receive considerable attention for thermal management. A copper film (CuFilm) is an excellent candidate due to the high κ (364 Wm −1 K −1 ) it possesses. However, the practical impleme...
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Published in: | Advanced engineering materials 2024-04, Vol.26 (7) |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | Low‐cost thermal interface materials with high thermal conductivity (
κ
) and low total thermal resistance (
R
t
) receive considerable attention for thermal management. A copper film (CuFilm) is an excellent candidate due to the high
κ
(364 Wm
−1
K
−1
) it possesses. However, the practical implementation is hindered by its high elastic modulus (
E
s
= 70.8 GPa), inducing a high contact thermal resistance (
R
c
= 91.6 mm
2
K W
−1
). Herein, the selective construction of electrically conducting or insulating layers on CuFilm to dramatically decrease
E
s
,
R
c
, and
R
t
is reported. The highly electrically and thermally conducting layer is synthesized by incorporating in situ reduced copper nanoparticles (CuNPs, 35 vol%) and multiwalled carbon nanotubes embellished with CuNPs (1.5 vol%) in polyethylene glycol. The high effective
κ
(92.7 Wm
−1
K
−1
) still maintains a low specimen thermal resistance (
R
s
= 4.9 mm
2
K W
−1
), while the dramatically softened surface (
E
s
= 5.7 GPa) decreases
R
c
(8.3 mm
2
K W
−1
), resulting in a very small
R
t
(13.2 mm
2
K W
−1
). Alternatively, the electrically insulating but thermally conducting layer is constructed using aluminum nitride particles. The
κ
is still high (72.1 Wm
−1
K
−1
) with a small
R
t
(47.5 mm
2
K W
−1
). The facile fabrication based on a CuFilm enables cost‐effective thermal interface materials with tunable electrical and thermal properties. |
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ISSN: | 1438-1656 1527-2648 |
DOI: | 10.1002/adem.202301823 |