Ion scattering spectroscopy and secondary ion mass spectrometry (ISS/SIMS) studies of zeolites

• Published in: Journal of catalysis 1983-01, Vol.84 (2), p.410-422
• Main Authors: Suib, Steven L., Coughlin, Daniel F., Otter, Fred A., Conopask, Leslie F.
• Format: Article
• Language: English
• Subjects: Catalysis; Catalysts: preparations and properties; Catalytic reactions; Chemistry; Exact sciences and technology; General and physical chemistry; General. Nomenclature, chemical documentation, computer chemistry; Theory of reactions, general kinetics; Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry
• ISSN: 0021-9517; 1090-2694
• DOI: 10.1016/0021-9517(83)90012-X

In an attempt to determine the applicability of ion scattering spectroscopy (ISS) and secondary ion mass spectrometry (SIMS) techniques to the analysis of zeolite systems, surface analyses of various natural and ion-exchanged synthetic zeolite samples have been carried out. A number of different mineral single crystals were studied both in an exchanged and in a natural form; also, ionexchanged synthetic powder samples, both hydrated and dehydrated, were subjected to analysis. The analyses were performed to obtain an elemental composition of the surface to determine such information as Si Al ratios and changes in the relative concentrations of exchanged metal species. The use of a high current density Ne 20 ion beam made possible depth profiling studies to monitor changes in Si Al ratios and metal ion concentrations as a function of depth from the surface. Depth profiling of both powder and single crystal metal-exchanged samples revealed that bulk and surface Si Al ratios are essentially the same. Changes in surface metal concentration of metal-exchanged samples as the result of dehydration were also observed in accord with previously reported results. Quantification of data was attempted through the use of relative elemental sensitivity factors and published sputter yields corrected for instrumental conditions. The results, even considering their semi-quantitative nature, display a good agreement with data obtained from previous scanning Auger microscopy, X-ray photoelectron studies, and fast atom bombardment mass spectrometry studies of zeolites as well as with other independent means of analysis to indicate the value of ISS/SIMS analyses to the study of zeolites.