Line width and line shape analysis in the inductively coupled plasma by high resolution Fourier transform spectrometry

High resolution Fourier transform spectrometry has been used to perform line width and line shape analysis of 81 Fe I emission lines in the spectral range 290–390 nm originating in the normal analytical zone of an inductively coupled plasma. Computer programs using non-linear least squares fitting t...

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Bibliographic Details
Published in:Spectrochimica acta. Part B: Atomic spectroscopy 1985, Vol.40 (1), p.135-143
Main Authors: Faires, Lynda M., Palmer, Byron A., Brault, James W.
Format: Article
Language:English
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Summary:High resolution Fourier transform spectrometry has been used to perform line width and line shape analysis of 81 Fe I emission lines in the spectral range 290–390 nm originating in the normal analytical zone of an inductively coupled plasma. Computer programs using non-linear least squares fitting techniques for line shape analysis were applied to the fully resolved spectra to determine Gaussian and Lorentzian components of the total observed line width. The Gaussian component was found to be the predominant effect, but the Lorentzian component was found to also contribute significantly. The effect of noise in the spectrum on the accuracy of the line fitting technique was assessed, and the importance of signal-to-noise ratio for accurate line shape analysis is demonstrated and discussed. Translational (Doppler) temperatures calculated from the Gaussian components of 81 lines were found to be 6310K with a relative standard deviation of 217K.
ISSN:0584-8547
1873-3565
DOI:10.1016/0584-8547(85)80017-3