Loading…

Growth of [formula omitted] strained layer superlattices by MOVPE III. Use of UV absorption to monitor alkyl stability in the reactor

InAsGaSb strained layer superlattices have been grown by atmospheric pressure MOVPE and the growth conditions optimised by observing, in real time, the in-situ UV absorption of the alkyls in the growth chamber. The Raman scattering of folded longitudinal acoustic phonons in the superlattices has bee...

Full description

Saved in:
Bibliographic Details
Published in:Journal of crystal growth 1997-01, Vol.170 (1-4), p.777-782
Main Authors: Booker, G.R., Daly, M., Klipstein, P.C., Lakrimi, M., Kuech, T.F., Li, Jiang, Lyapin, S.G., Mason, N.J., Murgatroyd, I.J., Portal, J.C., Nicholas, R.J., Symons, D.M., Vicente, P., Walker, P.J.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:InAsGaSb strained layer superlattices have been grown by atmospheric pressure MOVPE and the growth conditions optimised by observing, in real time, the in-situ UV absorption of the alkyls in the growth chamber. The Raman scattering of folded longitudinal acoustic phonons in the superlattices has been used as a probe of the periodicity of the superlattice. Atomic force microscopy has also been used to give information about the final surface morphology and RMS roughness of the superlattices. By combining all three techniques, optimum conditions have been found for the growth of short period InAsGaSb superlattices. These have been used to sandwich a long period superlattice designed for transport measurements. The use of the short period superlattices eliminated additional conducting layers at each end of the semimetallic superlattice and produced structures where the hole and electron densities are equal. Such structures exhibit a dramatic new quantum transport effect where the Hall resistance goes to zero at high pressures and low temperatures.
ISSN:0022-0248
1873-5002
DOI:10.1016/S0022-0248(96)00578-7