Analysis of ancient glass using ion beams and related techniques

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2002-10, Vol.195 (3), p.408-413
• Main Authors: Kossionides, S, Kokkoris, M, Karydas, A.G, Paradellis, T, Kordas, G, Moraitou, G
• Format: Article
• Language: English
• ISSN: 0168-583X; 1872-9584
• DOI: 10.1016/S0168-583X(02)01139-4

An interesting field of application of ion beam analysis techniques is the non-destructive examination of corrosion layers on cultural artifacts. This study is impeded by the non-uniformity of such layers, which renders the analysis difficult and requires the use of a combination of experimental techniques and analytical algorithms. In the present case, ancient glass fragments from Kenchreai, Greece, were analyzed with ion beam techniques, in order to examine the applicability of the latter to the characterization of the surface. The relative distribution of heavy components was determined by X-ray fluorescence. Nuclear reactions were used to determine the depth distribution of H, O, C and Si. Examination of the same samples with α-particles, indicates a depletion of silicon in the surface region of high hydrogen concentration, while the oxygen distribution is uniform. A detailed analysis, using the 28 Si (p, p) reaction, which resonates at 2.095 MeV, confirms the depletion and other non-uniformities in the silicon distribution.