Jumping mode scanning force microscopy: a suitable technique for imaging DNA in liquids

In this work, we introduce jumping mode (JM) scanning force microscopy (SFM) as a suitable technique for imaging soft samples in liquid environment like DNA adsorbed on mica. JM reveals as a non-intrusive technique where shear forces are minimized by performing the scanning motion without tip–sample...

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Bibliographic Details
Published in:Applied surface science 2003-03, Vol.210 (1), p.22-26
Main Authors: Moreno-Herrero, F, de Pablo, P.J, Álvarez, M, Colchero, J, Gómez-Herrero, J, Baró, A.M
Format: Article
Language:English
Subjects:
Atomic force microscopy
DNA
Jumping mode
Scanning force microscopy
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Summary:In this work, we introduce jumping mode (JM) scanning force microscopy (SFM) as a suitable technique for imaging soft samples in liquid environment like DNA adsorbed on mica. JM reveals as a non-intrusive technique where shear forces are minimized by performing the scanning motion without tip–sample contact. We find no visible damage on DNA samples and the nominal height of 2 nm of the molecules is achieved when imaging applying a maximum normal force of ∼150 pN. In addition to topographic images, adhesion maps of DNA are simultaneously recorded showing that the minimum adhesion force occurs on top of the DNA molecules.
ISSN:0169-4332
1873-5584
DOI:10.1016/S0169-4332(02)01473-3