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Two-dimensional dopant profiling by scanning capacitance force microscopy
We developed scanning capacitance force microscopy (SCFM) capable of mapping local differential capacitance (∂ C/∂ V), based on atomic force microscopy (AFM), by detecting an electrostatic force (ESF) between a tip and a sample. While an electric field alternating at an angular frequency ( ω) is app...
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Published in: | Applied surface science 2003-03, Vol.210 (1), p.93-98 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We developed scanning capacitance force microscopy (SCFM) capable of mapping local differential capacitance (∂
C/∂
V), based on atomic force microscopy (AFM), by detecting an electrostatic force (ESF) between a tip and a sample. While an electric field alternating at an angular frequency (
ω) is applied between the tip and the sample, an induced ESF oscillating at its third harmonic frequency (3
ω), which contain information on ∂
C/∂
V is detected using a lock-in amplifier (LIA). In this paper, we showed some dynamic-mode SCFM results obtained on a Si test sample. Clear dopant contrasts were obtained by dynamic-mode SCFM operated in air. An apparent position of the p–n junction was moved when an applied d.c. bias voltage was changed. A dynamic-mode SCFM image obtained in a vacuum condition utilizing frequency modulation (FM) detection method also showed clear dopant contrast. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/S0169-4332(02)01486-1 |