Possibility of subsurface investigations by scanning tunnelling microscope

Scanning tunnelling microscope (STM) is a highly local probe of topology. It is also sensitive, however, to the three-dimensional electronic structure of the materials. We discuss how these features may be combined to allow the STM to be used for subsurface investigations. In particular, we discuss...

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Bibliographic Details
Published in:Materials science & engineering. B, Solid-state materials for advanced technology Solid-state materials for advanced technology, 1998-02, Vol.51 (1), p.192-196
Main Authors: Chorniy, V.Z, Adkins, C.J
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronic transport in interface structures
Exact sciences and technology
Materials science
Materials testing
Methods of materials testing and analysis
Physics
Quantum size effects
Scanning tunnelling microscope
Scanning tunnelling spectroscopy
Surface double layers, schottky barriers, and work functions
Tunneling
Tunnelling
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Summary:Scanning tunnelling microscope (STM) is a highly local probe of topology. It is also sensitive, however, to the three-dimensional electronic structure of the materials. We discuss how these features may be combined to allow the STM to be used for subsurface investigations. In particular, we discuss in detail the STM observations of quantum size effects (QSE). Supplementary techniques concerned with the Schottky barrier, connectivity and crystal orientation mapping are also discussed briefly.
ISSN:0921-5107
1873-4944
DOI:10.1016/S0921-5107(97)00258-4